Optical Characterization of Microstructures and Optoelectronic Devices Based on Wide Band Gap Semiconductors

Name: Optical Characterization of Microstructures and Optoelectronic Devices Based on Wide Band Gap Semiconductors
Brand: Springer
Availability: OutOfStock
Rating: 5 (1 reviews)

By Shijie Xu

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Product details

Number of Pages:

385

Release Date:

2026-01-03

Publication Date:

2026-01-03

Publisher:

Springer

Languages:

Published: English, Original: English

ISBN10:

9819519276

GPSR Manufacturer Reference:

[email protected]

Weight:

750 g

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