MOS Interface Physics, Process and Characterization
% SALE
MOS Interface Physics, Process and Characterization
% SALE
% SALE
Description
The electronic device based on Metal Oxide Semiconductor (MOS) structure is the most important component of a large-scale integrated circuit and the key to achieving high performance devices. This book contains experimental examples focusing on MOS and will be a reference for academics and postgraduates in the field of microelectronics.
Product details
- Type:
- Book
- Binding:
- Paperback
- Edition:
- 1
- Languages:
-
Original:
English
- Number of Pages:
-
174
- Publisher:
-
CRC Press
- Publication Date:
-
2024-01-29
- Release Date:
-
2021-10-06
- ISBN / EAN:
-
9781032106281
- Weight:
-
262 g
- Dimensions:
-
15/23/1 cm
- GPSR Manufacturer Reference:
-
[email protected]
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