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MOS Interface Physics, Process and Characterization

By Shengkai Wang

MOS Interface Physics, Process and Characterization Business & Technology

MOS Interface Physics, Process and Characterization

By Shengkai Wang

0 - Default Title
Description
The electronic device based on Metal Oxide Semiconductor (MOS) structure is the most important component of a large-scale integrated circuit and the key to achieving high performance devices. This book contains experimental examples focusing on MOS and will be a reference for academics and postgraduates in the field of microelectronics.
Product details
Edition:
1
Number of Pages:
174
Release Date:
2021-10-05
Publication Date:
2021-10-12
Publisher:
CRC Press
Languages:
Original: English
ISBN10:
1032106271
ISBN13:
9781032106274
GPSR Manufacturer Reference:
[email protected]
Weight:
412 g
Height:
157 cm
Width:
235 cm
Thickness:
14 cm
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