Einführung in die Sekundärionenmassenspektrometrie - SIMS - (Teubner Studienbücher Physik)

Name: Einführung in die Sekundärionenmassenspektrometrie - SIMS - (Teubner Studienbücher Physik)
Brand: Teubner Verlag
Availability: OutOfStock
Rating: 5 (1 reviews)

By Miklos Riedel

0 - Default Title

Product details

Binding:: Paperback
Edition:: 1
Number of Pages:: 184
Publication Date:: 1999-01-01
Publisher:: Teubner Verlag
Languages:: Published: German, Original: German
ISBN10:: 3519032392
Weight:: 550 g

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