Integrated Circuit Metrology, Inspection, and Process Control VI: 9-11 March 1992 San Jose, California (Proceedings of Spie)

Name: Integrated Circuit Metrology, Inspection, and Process Control VI: 9-11 March 1992 San Jose, California (Proceedings of Spie)
Brand: SPIE Press
Availability: OutOfStock
Rating: 5 (1 reviews)

By Postek, Michael T.

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Product details

Binding:: Paperback
Number of Pages:: 697
Release Date:: 1992-05-01
Publication Date:: 1992-05-01
Publisher:: SPIE Press
Languages:: Published: English, Original: English
ISBN10:: 081940828X
Weight:: 505 g

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