Characterization of Oxide/Semiconductor Interfaces for Cmos Technologies (Materials Research Society Symposium Proceedings, Band 996)

Name: Characterization of Oxide/Semiconductor Interfaces for Cmos Technologies (Materials Research Society Symposium Proceedings, Band 996)
Brand: Curran Associates Inc
Availability: OutOfStock
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Product details

Binding:: Paperback
Number of Pages:: 174
Release Date:: 2008-11-08
Publication Date:: 2008-11-08
Publisher:: Curran Associates Inc
Languages:: Published: English, Original: English
ISBN10:: 1605604283

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