Placeholder text

Transmission Electron Microscopy

Transmission Electron Microscopy

0 - Default Title
Description
Transmission Electron Microscopy: Physics of Image Formation presents the theory of image and contrast formation, and the analytical modes in transmission electron microscopy. The principles of particle and wave optics of electrons are described. Electron-specimen interactions are discussed for evaluating the theory of scattering and phase contrast. Also discussed are the kinematical and dynamical theories of electron diffraction and their applications for crystal-structure analysis and imaging of lattices and their defects. X-ray microanalysis and electron energy-loss spectroscopy are treated as analytical methods. Specimen damage and contamination by electron irradiation limits the resolution for biological and some inorganic specimens. This fifth edition includes discussion of recent progress, especially in the area of aberration correction and energy filtering; moreover, the topics introduced in the fourth edition have been updated.
Transmission Electron Microscopy: Physics of Image Formation is written for scientists and application engineers in fields such as physics, chemistry, mineralogy, materials science and biology. Researchers, students, and other users of a transmission electron microscope can also benefit from this text.
Product details
Edition:
5
Number of Pages:
590
Release Date:
2008-08-28
Publication Date:
2008-08-28
Publisher:
Springer New York
Languages:
Original: English
ISBN10:
0387400931
ISBN13:
9780387400938
GPSR Manufacturer Reference:
Weight:
1035 g
Height:
159 cm
Width:
244 cm
Thickness:
40 cm
Currently sold out