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Scanning Electron Microscopy

By Ludwig Reimer

Scanning Electron Microscopy Natural Sciences

Scanning Electron Microscopy

0 - Default Title
Description
Scanning Electron Microscopy provides a description of the physics of electron-probe formation and of electron-specimen interactions. The different imaging and analytical modes using secondary and backscattered electrons, electron-beam-induced currents, X-ray and Auger electrons, electron channelling effects, and cathodoluminescence are discussed to evaluate specific contrasts and to obtain quantitative information.
Product details
Edition:
2
Number of Pages:
544
Release Date:
1998-09-17
Publication Date:
1998-09-17
Publisher:
Springer
Languages:
Original: English
ISBN10:
3540639764
ISBN13:
9783540639763
GPSR Manufacturer Reference:
[email protected]
Weight:
975 g
Height:
160 cm
Width:
241 cm
Thickness:
35 cm
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