Reliability of high-k / metal gate field-effect transistors considering circuit operational constraints

Name: Reliability of high-k / metal gate field-effect transistors considering circuit operational constraints
Brand: BoD – Books on Demand
Availability: OutOfStock
Rating: 5 (1 reviews)

By Steve Kupke

0 - Default Title

Product details

Binding:: Paperback
Edition:: 1
Number of Pages:: 124
Release Date:: 2016-06-06
Publication Date:: 2016-06-06
Publisher:: BoD – Books on Demand
Languages:: Published: English, Original: English
ISBN10:: 3741208698
GPSR Manufacturer Reference:: [email protected]
Weight:: 159 g

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