Placeholder text

Go to cart

Scanning Electron Microscopy

By Viacheslav Kazmiruk

Scanning Electron Microscopy

By Viacheslav Kazmiruk

0 - Default Title
Description
Today, an individual would be hard-pressed to find any science field that does not employ methods and instruments based on the use of fine focused electron and ion beams. Well instrumented and supplemented with advanced methods and techniques, SEMs provide possibilities not only of surface imaging but quantitative measurement of object topologies, local electrophysical characteristics of semiconductor structures and performing elemental analysis. Moreover, a fine focused e-beam is widely used for the creation of micro and nanostructures. The books approach covers both theoretical and practical issues related to scanning electron microscopy. The book has 41 chapters, divided into six sections: Instrumentation, Methodology, Biology, Medicine, Material Science, Nanostructured Materials for Electronic Industry, Thin Films, Membranes, Ceramic, Geoscience, and Mineralogy. Each chapter, written by different authors, is a complete work which presupposes that readers have some background knowledge on the subject.
Product details
Number of Pages:
844
Release Date:
2012-03-09
Publication Date:
2012-03-09
Publisher:
IntechOpen
Languages:
Original: English
ISBN10:
9535100920
ISBN13:
9789535100928
GPSR Manufacturer Reference:
[email protected]
Weight:
2011 g
Height:
185 cm
Width:
266 cm
Thickness:
62 cm
Buy on Amazon
Currently sold out