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Quantum Dots on Patterned Substrates: Towards Order at the Nanoscale

Product Image: Quantum Dots on Patterned Substrates: Towards Order at the Nanoscale

Quantum Dots on Patterned Substrates: Towards Order at the Nanoscale

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Description
This work covers some of the newly discovered properties of the Si-Ge system from a scientific point of view, not forgetting its technological relevance. After the Introduction, where the general features of the growth of Ge on Si are briefly covered, Chap. 1 focuses on the elastic properties of GeSi quantum dots and collects results. In Chap. 2 the study is extended to more than one dot, to reveal their mutual interaction. It is worth to study, in Chap. 3, the effect of a further deposition of Si on an already formed Ge-on-Si system, because of the potential technological application. Later, Chap. 4 presents an important part, namely the study of Ge/Si when the Si substrate is artificially patterned. Here, a total-energy scheme, able to predict the critical volume for island nucleation and shape transition, is extended to quantum dots grown on patterned substrates. Finally, Chap. 5 tackles the problem of mixing between Ge and Si, and gives some theoretical predictions for realistic Ge/Si islands. Due to their relevance, App. 1 reviews the major experimental techniques available to pattern Si substrates.
Product details
Binding:
Paperback
Number of Pages:
160
Release Date:
2010-06-10
Publication Date:
2010-06-10
Publisher:
LAP LAMBERT Academic Publishing
Languages:
Original: English
ISBN10:
3838367162
ISBN13:
9783838367163
Weight:
256 g
Height:
150 cm
Width:
220 cm
Thickness:
11 cm
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