Atomic Force Microscopy

Name: Atomic Force Microscopy
Brand: Wiley
Availability: OutOfStock
Rating: 5 (1 reviews)

By Greg Haugstad

0 - Default Title

Description

This book enlightens readers on the basic surface properties and distance-dependent intersurface forces one must understand to obtain even simple data from an atomic force microscope (AFM). The material becomes progressively more complex throughout the book, explaining details of calibration, physical origin of artifacts, and signal/noise limitations. Coverage spans imaging, materials property characterization, in-liquid interfacial analysis, tribology, and electromagnetic interactions.

"Supplementary material for this book can be found by entering ISBN 9780470638828 on booksupport.wiley.com"

Product details

Edition:

1

Number of Pages:

528

Release Date:

2012-10-16

Publication Date:

2012-09-24

Publisher:

Wiley

Languages:

Original: English

ISBN10:

0470638826

ISBN13:

9780470638828

GPSR Manufacturer Reference:

[email protected]

Weight:

782 g

Height:

215 cm

Width:

241 cm

Thickness:

32 cm

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