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Progress in Materials Analysis

By M. Grasserbauer

Progress in Materials Analysis Computer Science

Progress in Materials Analysis

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Description
Vol. 2 of "Progress in Materials Analysis" contains the lectures of the 12th Colloquium on Materials Analysis, Vienna, May 13-15, 1985. Due to the top level international participation from industry and research insti­ tutions the proceedings offer a survey of the present state and current trends in materials analysis of high actuality. The major topics covered are surface, micro and trace analysis of materials with a special emphasis on metals but also including other materials like ceramics, semiconductors, polymers. According to the strategy of the meeting attention is focussed on an interdisciplinary approach to materials science - combining analytical chemistry, solid state physics and technol­ ogy. Therefore progress reports on modern analytical technique like SIMS, SNMS, AES, XPS, Positron Annihilation Spectroscopy, EPMA, STEM, LAMMS, etc. are contained as well as presentations on the development of materials. The majority of the contributions centers on the treatment of important problems in materials science and technology by a (mostly sophisticated) combination of physical and chemical analytical techniques. Vienna, July 1985 M. Grasserbauer Contents Page Hercules, D. M. Surface Characterization of Thin Organic Films on Metals ............................................. .
Product details
Binding:
Paperback
Edition:
1
Number of Pages:
396
Release Date:
2013-10-04
Publication Date:
1985-12-17
Publisher:
Springer
Languages:
Original: English
ISBN10:
3211819053
ISBN13:
9783211819050
GPSR Manufacturer Reference:
[email protected]
Weight:
572 g
Height:
152 cm
Width:
229 cm
Thickness:
22 cm
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