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Testing for Small-Delay Defects in Nanoscale CMOS Integrated Circuits

By Goel, Sandeep K.

Testing for Small-Delay Defects in Nanoscale CMOS Integrated Circuits

By Goel, Sandeep K.

0 - Default Title
Description
Advances in design methods and process technologies are leading to a continuous increase in the complexity of integrated circuits (ICs). However, the increased complexity and nanometer-size features of modern ICs make them susceptible to manufacturing defects, as well as performance and quality issues. This book covers common problems in areas such as process variations, power supply noise, crosstalk, resistive opens/bridges, and design-for-manufacturing (DfM)-related rule violations. The book also addresses testing for small-delay defects (SDDs), which can cause timing failures on both critical and non-critical paths in the circuit.
Product details
Binding:
Paperback
Edition:
1
Number of Pages:
264
Release Date:
2017-04-21
Publication Date:
2017-03-29
Publisher:
CRC Press
Languages:
Original: English
ISBN10:
1138075779
ISBN13:
9781138075771
GPSR Manufacturer Reference:
[email protected]
Weight:
406 g
Height:
156 cm
Width:
234 cm
Thickness:
14 cm
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