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Secondary Ion Mass Spectrometry and Its Application to Materials Science

By Sarah Fearn

Secondary Ion Mass Spectrometry and Its Application to Materials Science Business & Technology

Secondary Ion Mass Spectrometry and Its Application to Materials Science

0 - Default Title
Description
In this edition, a more detailed overview of the principles of SIMS is given, and of how the development of dual-beam instruments has blurred the traditional fields of dynamic and static SIMS to enable greater analytical possibilities. This is an ideal text for final year undergraduates, first year PhD students, and anyone who may be starting out using secondary ion mass spectrometry as part of their research.
Product details
Edition:
2
Number of Pages:
125
Release Date:
2025-10-30
Publication Date:
2025-11-30
Publisher:
IOP Publishing Ltd
Languages:
Original: English
ISBN10:
0750333294
ISBN13:
9780750333290
GPSR Manufacturer Reference:
[email protected]
Weight:
410 g
Height:
182 cm
Width:
257 cm
Thickness:
13 cm
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