Reliability Wearout Mechanisms in Advanced CMOS Technologies (IEEE Press Series on Microelectronic Systems)

Name: Reliability Wearout Mechanisms in Advanced CMOS Technologies (IEEE Press Series on Microelectronic Systems)
Brand: Wiley-IEEE Press
Availability: OutOfStock
Rating: 5 (1 reviews)

By Rauch III, Stewart E.

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Product details

Edition:

1

Number of Pages:

640

Release Date:

2009-09-04

Publication Date:

2009-09-04

Publisher:

Wiley-IEEE Press

Languages:

Published: English, Original: English

ISBN10:

0471731722

ISBN13:

9780471731726

GPSR Manufacturer Reference:

[email protected]

Weight:

215 g

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