Testing Sequence Dependent Defects
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Testing Sequence Dependent Defects
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Description
With new technologies that continue to shrink the feature size of integrated circuits into deep sub-micron domain, there is an increasingly higher incidence of sequence dependent defects during manufacturing. Two-pattern tests are therefore being used in manufacturing testing to supplement the traditional method of single pattern tests based on the stuck-at fault model. In this work we present methods of generating and applying two-pattern test sets to enable high quality and cost effective testing of sequence dependent defects such as transition delay faults, transistor stuck-open faults etc.
Product details
- Type:
- Book
- Binding:
- Paperback
- Languages:
-
Original:
English
- Number of Pages:
-
116
- Publisher:
-
LAP LAMBERT Academic Publishing
- Publication Date:
-
2010-05-21
- Release Date:
-
2009-09-22
- ISBN / EAN:
-
9783838312194
- Weight:
-
191 g
- Dimensions:
-
15/22/1 cm
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