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Thin Film Deposition and Characterization Techniques

Thin Film Deposition and Characterization Techniques

0 - Default Title
Description
This book presents a focused overview of thin-film deposition techniques and their evaluation for advanced energy-storage systems. It highlights two cost-effective and versatile fabrication methods hydrothermal synthesis and electrodeposition, which enable controlled tuning of film morphology, structure, and composition under mild processing conditions. A major emphasis is placed on characterization, as the performance of thin films is closely linked to their structural, chemical, and morphological features. The book covers key analytical tools such as X-ray Diffraction (XRD), Raman spectroscopy, SEM, X-ray Photoelectron Spectroscopy (XPS), BET analysis, and FTIR, explaining how each technique contributes to understanding crystallinity, bonding, oxidation states, elemental composition, and surface area .Additionally, the book details electrochemical performance assessment through CV, GCD and EIS analysis. The book serves as a practical guide for students, researchers, and engineers working on the fabrication and analysis of functional thin films for next-generation energy-storage technologies.
Product details
Binding:
Paperback
Number of Pages:
52
Release Date:
2025-11-28
Publication Date:
2025-11-28
Publisher:
LAP LAMBERT Academic Publishing
Languages:
Original: English
ISBN10:
6209396127
ISBN13:
9786209396120
Weight:
96 g
Height:
150 cm
Width:
220 cm
Thickness:
4 cm
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