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X-Ray Scattering Techniques for Epitaxial Oxide Thin Films

X-Ray Scattering Techniques for Epitaxial Oxide Thin Films

0 - Default Title
Description
Introduction to oxide thin films and context.- Laboratory-based x-ray diffraction techniques for thin films.- Synchrotron techniques to map ferroelectric domain structures including superlattices.- Coherent X-ray methods.- Magnetic scattering and dichroism techniques.- Probing oxygen octahedra and weak ordering phenomena.- Time-resolved x-ray scattering techniques.- Future developments and perspectives.
Product details
Number of Pages:
196
Release Date:
2025-08-12
Publication Date:
2025-08-12
Publisher:
Springer
Languages:
Original: English
ISBN10:
9819659442
ISBN13:
9789819659449
GPSR Manufacturer Reference:
Weight:
499 g
Height:
160 cm
Width:
241 cm
Thickness:
16 cm
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