Unified Methods for VLSI Simulation and Test Generation (The Springer International Series in Engineering and Computer Science, 73, Band 73)

Name: Unified Methods for VLSI Simulation and Test Generation (The Springer International Series in Engineering and Computer Science, 73, Band 73)
Brand: Springer
Availability: OutOfStock
Rating: 5 (1 reviews)

By Kwang-Ting (Tim) Cheng

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Product details

Edition:

1

Number of Pages:

160

Release Date:

1989-06-30

Publication Date:

1989-06-30

Publisher:

Springer

Languages:

Published: English, Original: English

ISBN10:

0792390253

GPSR Manufacturer Reference:

[email protected]

Weight:

431 g

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