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Advanced Materials Characterization

By Kumar, Ch Sateesh

Advanced Materials Characterization Business & Technology

Advanced Materials Characterization

By Kumar, Ch Sateesh

0 - Default Title
Description
The book covers various methods of characterization of advanced materials commonly used in engineering including understanding of the working principle and applicability of devices. Major instruments covered include X-Ray Diffraction, NSOM Raman, X-Ray Photo Spectroscopy, UV-VIS- NIR Spectrosphotometer, FTIR Spectroscopy, and so forth.
Product details
Edition:
1
Number of Pages:
144
Release Date:
2023-05-04
Publication Date:
2023-05-04
Publisher:
CRC Press
Languages:
Original: English
ISBN10:
1032375108
ISBN13:
9781032375106
Weight:
388 g
Height:
161 cm
Width:
240 cm
Thickness:
13 cm
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