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Surface and Thin Film Analysis

By Henning Bubert

Surface and Thin Film Analysis

By Henning Bubert

0 - Default Title
Description
Surveying and comparing all techniques relevant for practical applications in surface and thin film analysis, this second edition of a bestseller is a vital guide to this hot topic in nano- and surface technology. This new book has been revised and updated and is divided into four parts - electron, ion, and photon detection, as well as scanning probe microscopy. New chapters have been added to cover such techniques as SNOM, FIM, atom probe (AP),and sum frequency generation (SFG). Appendices with a summary and comparison of techniques and a list of equipment suppliers make this book a rapid reference for materials scientists, analytical chemists, and those working in the biotechnological industry.

 

From a Review of the First Edition (edited by Bubert and Jenett)

"... a useful resource..."

(Journal of the American Chemical Society)
Product details
Edition:
2
Number of Pages:
558
Release Date:
2011-04-20
Publication Date:
2011-04-20
Publisher:
Wiley-VCH
Languages:
Original: English
ISBN10:
3527320474
ISBN13:
9783527320479
GPSR Manufacturer Reference:
[email protected]
Weight:
1208 g
Height:
170 cm
Width:
240 cm
Thickness:
31 cm
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