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Hierarchical Modeling for VLSI Circuit Testing (The Springer International Series in Engineering and Computer Science, 89, Band 89)

By Debashis Bhattacharya

Hierarchical Modeling for VLSI Circuit Testing (The Springer International Series in Engineering and Computer Science, 89, Band 89) Computer Science

Hierarchical Modeling for VLSI Circuit Testing (The Springer International Series in Engineering and Computer Science, 89, Band 89)

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Product details
Edition:
1
Number of Pages:
172
Release Date:
1989-12-31
Publication Date:
1989-12-31
Publisher:
Springer
Languages:
Published: English, Original: English
ISBN10:
079239058X
GPSR Manufacturer Reference:
[email protected]
Weight:
476 g
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