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Scanning Probe Microscopy

By Bert Voigtländer

Scanning Probe Microscopy book

Scanning Probe Microscopy

By Bert Voigtländer

0 - Default Title
Description
This book explains the operating principles of atomic force microscopy and scanning tunneling microscopy. The aim of this book is to enable the reader to operate a scanning probe microscope successfully and understand the data obtained with the microscope. The chapters on the scanning probe techniques are complemented by the chapters on fundamentals and important technical aspects. This textbook is primarily aimed at graduate students from physics, materials science, chemistry, nanoscience and engineering, as well as researchers new to the field.
Product details
Edition:
1
Number of Pages:
400
Release Date:
2015-03-23
Publication Date:
2015-03-23
Publisher:
Springer
Languages:
Original: English
ISBN10:
3662452391
ISBN13:
9783662452394
Weight:
764 g
Height:
160 cm
Width:
241 cm
Thickness:
27 cm
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