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Controlling the aging of power transistors

By Tarek Ben Salah

Controlling the aging of power transistors Business & Technology

Controlling the aging of power transistors

0 - Default Title
Description
This book presents an in-depth experimental study of the behavior of SiC JFET transistors for demanding aerospace applications. A complete methodology is described, including the design of an automated test bench via LabView, robustness tests to determine the critical energy, and accelerated aging tests to monitor the evolution of electrical parameters. The results obtained highlight reliable degradation indicators and open up interesting prospects for the design of more resistant electronic systems in extreme environments.
Product details
Binding:
Paperback
Number of Pages:
88
Release Date:
2025-06-17
Publication Date:
2025-06-17
Publisher:
Our Knowledge Publishing
Languages:
Original: English
ISBN10:
6208939453
ISBN13:
9786208939458
GPSR Manufacturer Reference:
[email protected]
Weight:
149 g
Height:
150 cm
Width:
220 cm
Thickness:
6 cm
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