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Exponential Fatigue Life Model for Single-Edge-Notched Beams

By Baliarsingh, Avaya Kumar

Exponential Fatigue Life Model for Single-Edge-Notched Beams Business & Technology

Exponential Fatigue Life Model for Single-Edge-Notched Beams

0 - Default Title
Description
This book presents a comprehensive and practical exploration of fatigue crack propagation in single-edge-notched (SEN) beams through the application of an exponential modelling framework. Designed for researchers, engineers, and advanced students, it bridges fundamental fracture mechanics with modern predictive methodologies for evaluating fatigue life. The text offers clear theoretical insights, validated analytical models, and illustrative case studies that demonstrate the accuracy and usefulness of exponential crack growth laws in structural assessment. By combining scientific rigor with accessible explanations, this book equips readers with the knowledge and tools needed to predict fatigue behaviour more reliably, enhance material integrity, and support safer, more efficient engineering designs.
Product details
Binding:
Paperback
Number of Pages:
80
Release Date:
2025-11-30
Publication Date:
2025-11-30
Publisher:
LAP LAMBERT Academic Publishing
Languages:
Original: English
ISBN10:
6209272835
ISBN13:
9786209272837
Weight:
137 g
Height:
150 cm
Width:
220 cm
Thickness:
5 cm
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