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On-Wafer Calibration Techniques Enabling Accurate Characterization of High-Performance Silicon Devices at the MM-Wave Range and Beyond

On-Wafer Calibration Techniques Enabling Accurate Characterization of High-Performance Silicon Devices at the MM-Wave Range and Beyond Business & Technology

On-Wafer Calibration Techniques Enabling Accurate Characterization of High-Performance Silicon Devices at the MM-Wave Range and Beyond

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Product details
Binding:
Paperback
Edition:
1
Number of Pages:
278
Release Date:
2024-10-21
Publication Date:
2024-10-21
Publisher:
River Publishers
Languages:
Published: English, Original: English
ISBN10:
8770043566
GPSR Manufacturer Reference:
Weight:
453 g
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