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Formation and Properties of Dislocations during Crystal Growth of Bulk Silicon Carbide by the Physical Vapor Transport Method (Berichte aus der Halbleitertechnik)

Formation and Properties of Dislocations during Crystal Growth of Bulk Silicon Carbide by the Physical Vapor Transport Method (Berichte aus der Halbleitertechnik) Business & Technology

Formation and Properties of Dislocations during Crystal Growth of Bulk Silicon Carbide by the Physical Vapor Transport Method (Berichte aus der Halbleitertechnik)

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Product details
Binding:
Paperback
Edition:
1
Number of Pages:
155
Release Date:
2008-08-01
Publication Date:
2008-08-01
Publisher:
Shaker
Languages:
Published: English, Original: English
ISBN10:
3832274243
Weight:
233 g
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