Testing Sequence Dependent Defects
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Testing Sequence Dependent Defects
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Beschreibung
With new technologies that continue to shrink the feature size of integrated circuits into deep sub-micron domain, there is an increasingly higher incidence of sequence dependent defects during manufacturing. Two-pattern tests are therefore being used in manufacturing testing to supplement the traditional method of single pattern tests based on the stuck-at fault model. In this work we present methods of generating and applying two-pattern test sets to enable high quality and cost effective testing of sequence dependent defects such as transition delay faults, transistor stuck-open faults etc.
Produktdetails
- Typ:
- Buch
- Einband:
- Taschenbuch
- Sprachen:
-
Original:
Englisch
- Seitenzahl:
-
116
- Herausgeber:
-
LAP LAMBERT Academic Publishing
- Veröffentlichungsdatum:
-
2010-05-21
- Erscheinungsdatum:
-
2009-09-22
- ISBN / EAN:
-
9783838312194
- Gewicht:
-
191 g
- Maße:
-
15/22/1 cm
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