{"product_id":"shengkai-wang-mos-interface-physics-process-and-characterization-9781032106274","title":"MOS Interface Physics, Process and Characterization","description":"The electronic device based on Metal Oxide Semiconductor (MOS) structure is the most important component of a large-scale integrated circuit and the key to achieving high performance devices. This book contains experimental examples focusing on MOS and will be a reference for academics and postgraduates in the field of microelectronics.","brand":"CRC Press","offers":[{"title":"Default Title","offer_id":53698009629014,"sku":null,"price":0.0,"currency_code":"EUR","in_stock":false}],"thumbnail_url":"\/\/cdn.shopify.com\/s\/files\/1\/0925\/5829\/5382\/files\/product_image_9781032106274_1.jpg?v=1778863286","url":"https:\/\/www.momoxbooks.com\/products\/shengkai-wang-mos-interface-physics-process-and-characterization-9781032106274","provider":"momoxbooks","version":"1.0","type":"link"}