{"product_id":"michael-pecht-guidebook-for-managing-silicon-chip-reliability-9780849396243","title":"Guidebook for Managing Silicon Chip Reliability","description":"This is an excellent text detailing situations the professional will encounter in practice. The book: * Includes an extensive table detailing the types of mechanism failures, such as self-heating and hot carrier aging. * Examines deep sub-micron challenges, such as power dissipation, switching noise, and cross talk * Outlines how to establish the specifications defining chip performance, cost, quality, and reliability. * Concentrates on device failure and causes throughout the text - showing how to model the mechanism, test for defects, and avoid and manage damange. * Presents information on evolving IC technologies. TOC:Introduction.- How Devices Fail.- Intrinsic Device Sensitivities.- Electromigration.- Hot Carrier Aging.- Time Dependent Dielectric Breakdown. Mechanical Stress Induced Migration.- Alpha Particle Sensitivity.- Electrostatic Discharge and Electrical Overstress. Latch-Up. Qualification. Screening. Design for Reliability. Summary.","brand":"CRC Press","offers":[{"title":"Default Title","offer_id":53711353774422,"sku":null,"price":0.0,"currency_code":"EUR","in_stock":false}],"thumbnail_url":"\/\/cdn.shopify.com\/s\/files\/1\/0925\/5829\/5382\/files\/product_image_9780849396243_1.jpg?v=1778873084","url":"https:\/\/www.momoxbooks.com\/products\/michael-pecht-guidebook-for-managing-silicon-chip-reliability-9780849396243","provider":"momoxbooks","version":"1.0","type":"link"}