{"product_id":"ludwig-reimer-scanning-electron-microscopy-9783540639763","title":"Scanning Electron Microscopy","description":"Scanning Electron Microscopy provides a description of the physics of electron-probe formation and of electron-specimen interactions. The different imaging and analytical modes using secondary and backscattered electrons, electron-beam-induced currents, X-ray and Auger electrons, electron channelling effects, and cathodoluminescence are discussed to evaluate specific contrasts and to obtain quantitative information.","brand":"Springer","offers":[{"title":"Default Title","offer_id":53626786120022,"sku":null,"price":0.0,"currency_code":"EUR","in_stock":false}],"thumbnail_url":"\/\/cdn.shopify.com\/s\/files\/1\/0925\/5829\/5382\/files\/product_image_9783540639763_1_a0e97f86-8b85-4285-8716-eeec278fb75f.jpg?v=1778667254","url":"https:\/\/www.momoxbooks.com\/products\/ludwig-reimer-scanning-electron-microscopy-9783540639763","provider":"momoxbooks","version":"1.0","type":"link"}