{"product_id":"devta-narendra-prasanna-testing-sequence-dependent-defects-9783838312194","title":"Testing Sequence Dependent Defects","description":"With new technologies that continue to shrink the feature size of integrated circuits into deep sub-micron domain, there is an increasingly higher incidence of sequence dependent defects during manufacturing. Two-pattern tests are therefore being used in manufacturing testing to supplement the traditional method of single pattern tests based on the stuck-at fault model. In this work we present methods of generating and applying two-pattern test sets to enable high quality and cost effective testing of sequence dependent defects such as transition delay faults, transistor stuck-open faults etc.","brand":"LAP LAMBERT Academic Publishing","offers":[{"title":"Default Title","offer_id":54734740881750,"sku":null,"price":0.0,"currency_code":"EUR","in_stock":false}],"thumbnail_url":"\/\/cdn.shopify.com\/s\/files\/1\/0925\/5829\/5382\/files\/product_image_9783838312194_1.jpg?v=1791024848","url":"https:\/\/www.momoxbooks.com\/products\/devta-narendra-prasanna-testing-sequence-dependent-defects-9783838312194","provider":"momox","version":"1.0","type":"link"}