{"product_id":"ch-kumar-sateesh-advanced-materials-characterization-9781032375106","title":"Advanced Materials Characterization","description":"The book covers various methods of characterization of advanced materials commonly used in engineering including understanding of the working principle and applicability of devices. Major instruments covered include X-Ray Diffraction, NSOM Raman, X-Ray Photo Spectroscopy, UV-VIS- NIR Spectrosphotometer, FTIR Spectroscopy, and so forth.","brand":"CRC Press","offers":[{"title":"Default Title","offer_id":53702910509398,"sku":null,"price":0.0,"currency_code":"EUR","in_stock":false}],"thumbnail_url":"\/\/cdn.shopify.com\/s\/files\/1\/0925\/5829\/5382\/files\/product_image_9781032375106_1_0d47e34f-f129-4352-b3aa-376779114928.jpg?v=1778867245","url":"https:\/\/www.momoxbooks.com\/products\/ch-kumar-sateesh-advanced-materials-characterization-9781032375106","provider":"momoxbooks","version":"1.0","type":"link"}