{"product_id":"bhattacharya-debashis-hierarchical-modeling-for-vlsi-circuit-testing-the-springer-international-series-in-engineering-and-computer-science-89-band-89-9780792390589","title":"Hierarchical Modeling for VLSI Circuit Testing (The Springer International Series in Engineering and Computer Science, 89, Band 89)","description":null,"brand":"Springer","offers":[{"title":"Default Title","offer_id":53755540046166,"sku":null,"price":0.0,"currency_code":"EUR","in_stock":false}],"thumbnail_url":"\/\/cdn.shopify.com\/s\/files\/1\/0925\/5829\/5382\/files\/product_image_9780792390589_1.jpg?v=1781795703","url":"https:\/\/www.momoxbooks.com\/products\/bhattacharya-debashis-hierarchical-modeling-for-vlsi-circuit-testing-the-springer-international-series-in-engineering-and-computer-science-89-band-89-9780792390589","provider":"momoxbooks","version":"1.0","type":"link"}